TY - JOUR
BT - IEEE Industrial Electronics Magazine
DA - Sept. 2010 
DO - 10.1109/MIE.2010.937937
IS - 3
LA - eng
PY - 2010
SP - 7 
EP -  18
T2 - IEEE Industrial Electronics Magazine
TI - IMM-UKF Versus Frequency Analysis [Past and Present]
VL - 4
ER -